Xuesong LiUniversity of Electronic Science and Technology of China, China
Dr. Xuesong Li is the inventor of the method of synthesis of large-area graphene films on Cu foils by chemical vapor deposition of methane. He got his B.S. and M.S. from Tsinghua University in 2000 and 2003, respectively and his Ph.D. from Rensselaer Polytechnic Institute in US in 2007. From May 2007 to Jan. 2012 Dr. Li pursued his post doctorate research in UT Austin and IBM T. J. Watson Research Center, respectively. In Feb. 2012, Dr. Li, together with his colleagues, co-founded Bluestone Global Tech, a company on graphene commercialization, and then LasLumin LLC in Jun. 2014. Dr. Li was awarded the 11th China 1000-talent plan (young-talent) and joined University of Electronic Science and Technology of China in 2015 as a professor. Dr. Li’s research interests are synthesis and applications of carbon nanomaterials such as carbon nanotubes and graphene. He has published 47 papers in peer reviewed journals such as Science, Nature Nanotechnology, Nature Materials, Nature Photonics, etc. with total citations over 14000, including 14 ESI highly-cited papers. His research work has been widely reported by multi-media such as BBC news, Nature, ScienceDaily, C&EN, etc. His work on graphene synthesis by chemical vapor deposition of methane on copper foil substrate, which was published in Science in 2009, was selected as one of the breakthroughs in 2009 by Science and has been cited close to 5000 times. This invention has been widely used in both academy and industry up to date for graphene film production.
Title:CVD graphene: preparation, characterization and application
SymposiumStrategic Frontier
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Abstract
本报告将介绍我们在铜基底化学气相沉积石墨烯的最新进展,包括其制备、表征和应用。在制备方面,我将报告没有任何附加层的大面积单层石墨烯(SLG)的制备及其生长机制。迄今为止,对石墨烯层数及在大面积上的均匀性的精确控制仍然是石墨烯薄膜制备领域的一大难题。我们发现,与铜箔的表面、反应气氛等影响石墨烯层数的因素相比,存在其它关键因素同样影响石墨烯附加层的生长,控制这一因素,即使在未处理的(具有粗糙表面)铜箔基底上使用常规CVD工艺也可以制备面积达几十平方厘米的大面积无附加层SLG薄膜。这一发现不仅对大面积无附加层SLG薄膜的工业化生产具有重要意义,而且对制备均匀的少层石墨烯也有一定的指导意义。在表征方面,我将报告一种利用范德堡霍尔测量来评估石墨烯电输运性能的通用且简单的方法。通过在真空中退火石墨烯以除去吸附的掺杂剂,然后将其暴露在周围环境中,由于掺杂剂从环境中重新吸附,可以测量载流子迁移率随其浓度增加的变化,并发现载流子迁移率和浓度之间可以简单地近似为指数关系,从而可以将任何一对测量的载流子迁移率和浓度归一化到任意的载流子浓度以进行比较。我们实验证明了该方法的可靠性,这比制造器件简单得多,并且可以促进石墨烯表征的标准化。在应用方面,我将报告石墨烯在辐射环境中的潜在应用。