Andrew J. PollardNational Physical Laboratory，UK
After joining NPL in 2009, Andrew is now leading the Surface and Nanoanalysis Group's research into the structural and chemical characterisation of graphene and related 2D materials, with a focus on enabling industrial commercialisation in this area. This metrology research addresses the actual measurement of 2D materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS).
Andrew is a member of the ISO working group ‘Measurement and Characterisation’ within the ‘Nanotechnologies’ Technical Committee (TC229), and a UK nominated expert for the international standards currently in development in ISO/TC229 and IEC/TC113. As part of his role as the Industry Standardisation Leader at the NGMC, he is leading two international standards within ISO/TC229 and heavily engaged with companies around the world producing or using graphene. Andrew is a Visiting Academic at the National Graphene Institute (NGI) at the University of Manchester, the co-chair of the VAMAS Technical Working Area ‘TWA 41: Graphene and Related 2D Materials’ and is on the advisory board of several graphene entities.
Title：International Standardisation of Graphene: Terminology and Characterisation Enabling Commercial Applications
SymposiumD1: Standardization Forum
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Abstract
There are many application areas where graphene and related 2D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. This measurement research has been used directly to develop international standards within the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC), within their ‘Nanotechnologies’ Technical Committees, TC229 and TC113 respectively. Here, two international standards currently under development and led by NPL will be described, ‘ISO/TS 80004-13: Nanotechnologies - Vocabulary - Part 13: Graphene and related two-dimensional materials’ and ‘ISO/PWI 21356: Nanotechnologies - Structural characterization of graphene’.
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