Norbert FabriciusKarlsruhe Institute of Technology (KIT), Germany
Dr. Norbert Fabricius graduated in Physics and received his PhD from the University of Essen in 1985. In his industrial career between 1986 and 2002 he developed materials and processes for the manufacturing of integrated optical components used in telecommunication networks. His last industrial position was Director Operations at JDS Uniphase in Germany.
In 2003 he joined the Research Centre Karlsruhe (now KIT) as the head of the Helmholtz Program “Microsystem Technologies” and “Nanotechnology”. Since 2008 he is responsible for nanotechnology standardization.
He has experience in standardization on the national (DKE, DIN) and international (IEC, ISO) level for 25 years in different technology areas as well as in industrial and academic environments. He acts as the Secretary for the IEC Technical Committee 113 “Nanotechnology standardization for electrical and electronic products and systems” and is a member in a number of related IEC and ISO technical committees. On the national level he is Divisional Chairman of Div. 1 “General electrical engineering, materials for electrotechnology, environmental protection” at the DKE and active in a number of national standardization committees.
His most recent activity is the establishment of a standardization committee within the EU FET Flagship Initiative Graphene and the CENELEC Workshop on “Specifications for Graphene Related Material”.
Title:Standardization – A tool to support the commercialization of graphene related technologies
SymposiumPlenary Lectures & Graphene Standardization
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Abstract
Graphene, derivate of graphene and other two dimensional materials have been identified as high potential materials for future innovative products especially in the electrotechnical industry. Enormous efforts have been made to increase the scientific knowledge regarding manufacturing of these materials with consistent properties. Nevertheless even today after publication of thousands of scientific papers it remains difficult to find material suppliers which are able to deliver consistent quality according to the need of the industry. Therefore the industry is asking for standards to specify the key control characteristics of graphene related materials and standardized measurement procedures to measure them. This demand has led to increasing interest of technical experts in industry and academia on standardization. Nevertheless the expected support from standardization will only be realized if the development of standards follows a systematic and sustainable process so that the whole system can be adjusted according to the technical progress. That ensures that the standards at any time represent the state of the art of the technology.
IEC/TC 113 has developed such a concept.It revolves around the central document, the standard IEC 62565-3-1. This so-called Blank Detail Specification (BDS) provides a template that lists all relevant Key Control Characteristics (KCC) and the standardized measurement protocols to measure them. Currently the working draft of IEC 62565-3-1 lists more than 30 KCCs including “number of layers”, “sheet conductance”, and “transmission”. The first international standards are now under publication and the number of standardization projects in the responsible standardization committee IEC/TC 113 is increasing rapidly.The roadmap for this process is defined byIEC 62565-3-1 as it provides a consensus list of KCCs for which measurement standards have to be developed.
This talk will provide a review of the international standardization activities and present the status reached within IEC/TC 113. It will point out the importance to coordinate the worldwide standardization activities and describe ways for participation and cooperation.All countries and industrial consortia are invited to join the committee and submit their New Work Item Proposals to fill the gaps for material specifications and KCC measurement procedures. The IEC provides an established consensus process but finally the quality of the standards depends from the input of the technical experts.